Hong Zhang

Hong Zhang is an Engineer and in charge of FEI Spherical Corrected Titan Cubed Themis G2 60-300 S/TEM of the Electron Microscopy Center at Lanzhou University. She received her B.S. in Materials Physics in 2011 and Ph.D. in Condensed Matter Physics in 2016, both from Lanzhou University. As a visiting scholar from 2015 to 2017, her research at the Electron Microscopy Center of Argonne National Laboratory focuses on the characterization of complex electronic oxides including high-temperature superconductors, magnetic oxides, and advanced battery materials with a particular emphasis on characterization by electron beam methods. She joined the school of Physical Science and Technology at Lanzhou University in 2017, in charge of FEI Probe Corrected Titan Themis G2 60-300 S/TEM including Monochromator, K2 IS DDC, Lorentz, Holography, Super X EDX, EELS, EFTEM and multiple in situ TEM holders. Now her research interests focus on development and application of spherical aberration-corrected transmission electron microscopy techniques to solve materials problems in catalysts, battery materials, photovoltaic films, and ferroelectric, piezoelectric, and superconducting oxide films etc. Development and application of various in-situ TEM holders to characterize materials under atmosphere, heating, cooling, biasing, tensile force or magnetic field. Another major research interest is nano-solder materials and nano welding techniques.

1. Application of advanced spherical-corrected transmission electron microscopy techniques to characterize materials such as catalysts, battery materials, oxide films, hard-coating films etc. 2. Development and application of various in-situ TEM holders to characterize materials under atmosphere, heating, cooling, biasing, tensile force or magnetic field. 3. Development and application of nanoscale solders and nano welding techniques.

(1) Hong Zhang, Xia Deng, Junwei Zhang, Desheng Xue, Yuanqing Huang, Haoli Zhang, Feiming Bai, Beverly. J. Inkson, Yong Peng*, Phase Transformation of Sn-based Nanowires under Electron Beam Irradiation, Journal of Materials Chemistry C, 2015.4.13, 3(21): 5389-5397. (2) Hong Zhang, Junwei Zhang，Qianqian Lan，Hongbin Ma，Ke Qu，Beverley J Inkson，Nigel J Mellors，Desheng Xue，Yong Peng*, Nanoscale characterization of 1D Sn-3.5Ag nanosolders and their application into nanowelding at the nanoscale, Nanotechnology, 2014, 25(42): 425301 (3) Qu Ke, Hong Zhang, Qianqian Lan, Xia Deng, Yuanqing Huang, Junwei Zhang, Beverley Inkson, Desheng Xue, Yong Peng*, Realization of the Welding of Individual TiO2 Semiconductor Nanoobjects by Using Novel 1D Au80Sn20 Nanosolder, Journal of Materials Chemistry C, 2015, 3(43): 11311-11317. (4) Xuan Zhang, Xiujun Zheng, Hong Zhang, Junli Zhang, Jiecai Fu, Qiang Zhang, Chaoyi Peng, Feiming Bai, Xixiang Zhang, Yong Peng*, Bottom-up nanoarchitectures of semiconductor nano-building blocks obtained via a controllable in situ SEM-FIB thermal soldering method, Journal of Materials Chemistry C, 2017, 5: 8707-8713. (5) Hongbin Ma, Junwei Zhang, Hong Zhang, Chaoshuai Guan, Qiang Zhang, Feiming Bai, Yong Peng* and Xixiang Zhang. Effects of interfacial transition layers on the electrical properties of individual Fe 30 Co 61 Cu 9/Cu multilayer nanowires. Journal of Materials Chemistry C, 2016, 4(2): 259-265. (6) Junwei Zhang, Hongbin Ma, Senfu Zhang, Hong Zhang, Xia Deng, Qianqian Lan, Desheng Xue, Feiming Bai, Nigel J. Mellors, and Yong Peng*, Nanoscale characterisation and magnetic property of Co81Cu19/Cu multilayer nanowires, Journal of Materials Chemistry C, 2015, 3(1): 85-93.